Hineva T.Petkova T.Petkov P.Mikli V.Socol G.Mihailescu C.Mihailescu I.2024-07-102024-07-102024-07-102024-07-102008-05-011742-65961742-658810.1088/1742-6596/113/1/012023SCOPUS_ID:44649087706https://rlib.uctm.edu/handle/123456789/137Bulk glasses of the (As2Se3)1-x (AgI) x and (AsSe)1-x(AgI)x systems, where x 5, 10, 15 up to 35 mol.% have been prepared by the melt-quenched technique. The thin films have been deposited by means of vacuum thermal evaporation (VTE) and pulsed laser deposition (PLD). The XRD investigation reveals a generally amorphous structure; small peaks are only observed in the samples with the highest AgI. The film compositions have been determined by EDS (energy dispersive X-ray microanalysis). WDS (wavelength dispersive spectroscopy) studies have shown that the films do not contain oxygen within the accuracy of the method (1 %). The films are dense with smooth surface as revealed by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). © 2008 IOP Publishing Ltd.enInfluence of the preparation method on the As-Se-AgI thin films behaviourArticle