Browsing by Author "Mihailescu I."

Now showing 1 - 1 of 1
  • No Thumbnail Available
    Item
    Influence of the preparation method on the As-Se-AgI thin films behaviour
    (2008-05-01) Hineva T.; Petkova T.; Petkov P.; Mikli V.; Socol G.; Mihailescu C.; Mihailescu I.
    Bulk glasses of the (As2Se3)1-x (AgI) x and (AsSe)1-x(AgI)x systems, where x 5, 10, 15 up to 35 mol.% have been prepared by the melt-quenched technique. The thin films have been deposited by means of vacuum thermal evaporation (VTE) and pulsed laser deposition (PLD). The XRD investigation reveals a generally amorphous structure; small peaks are only observed in the samples with the highest AgI. The film compositions have been determined by EDS (energy dispersive X-ray microanalysis). WDS (wavelength dispersive spectroscopy) studies have shown that the films do not contain oxygen within the accuracy of the method (1 %). The films are dense with smooth surface as revealed by using scanning electron microscopy (SEM) and atomic force microscopy (AFM). © 2008 IOP Publishing Ltd.