Optical properties of chalcogenide Ge-Te-In thin films

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creativework.publisherInstitute of Physics Publishinghelen.craven@iop.orgen
dc.contributor.authorZaidan A.
dc.contributor.authorIvanova V.
dc.contributor.authorPetkov P.
dc.date.accessioned2024-07-10T14:27:03Z
dc.date.accessioned2024-07-10T14:47:57Z
dc.date.available2024-07-10T14:27:03Z
dc.date.available2024-07-10T14:47:57Z
dc.date.issued2012-01-01
dc.description.abstractThin films of the chalcogenide (GeTe4)1-xIn x with various compositions (x 0, 5, 10, 15, 20 at %) were deposited under vacuum on glass substrates by thermal evaporation. The optical transmission and reflection spectra of the films at normal incidence were investigated in the spectral range from 800 to 2600 nm. Using the transmission spectra, the optical constants (refractive index (n) and extinction coefficient (k)) were calculated based on Swanepoel's method. The optical band gap (E gopt) was also estimated using Tauc's extrapolation procedure. © Published under licence by IOP Publishing Ltd.
dc.identifier.doi10.1088/1742-6596/356/1/012014
dc.identifier.issn1742-6596
dc.identifier.issn1742-6588
dc.identifier.scopusSCOPUS_ID:84860688157en
dc.identifier.urihttps://rlib.uctm.edu/handle/123456789/241
dc.language.isoen
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860688157&origin=inward
dc.titleOptical properties of chalcogenide Ge-Te-In thin films
dc.typeConference Paper
oaire.citation.issue1
oaire.citation.volume356
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