XPS characterization of TiO2 layers deposited on quartz plates

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creativework.publisherInstitute of Physics Publishingen
dc.contributor.authorStefanov P.
dc.contributor.authorShipochka M.
dc.contributor.authorStefchev P.
dc.contributor.authorRaicheva Z.
dc.contributor.authorLazarova V.
dc.contributor.authorSpassov L.
dc.date.accessioned2024-07-10T14:27:03Z
dc.date.accessioned2024-07-10T14:47:24Z
dc.date.available2024-07-10T14:27:03Z
dc.date.available2024-07-10T14:47:24Z
dc.date.issued2008-03-01
dc.description.abstractTiO2 layers for gas sensing applications were obtained by Liquid Phase Deposition (LPD). The layers were deposited on gold-coated piezoelectric quartz crystals. The surface structure, morphology and chemical properties were analysed by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM) and X-ray Photoelectron Spectroscopy (XPS). SEM showed that the layers were porous and composed of uniform crystalline grains. XPS indicated them to be non-stoichiometric. © 2008 IOP Publishing Ltd.
dc.identifier.doi10.1088/1742-6596/100/1/012039
dc.identifier.issn1742-6596
dc.identifier.issn1742-6588
dc.identifier.scopusSCOPUS_ID:44649151833en
dc.identifier.urihttps://rlib.uctm.edu/handle/123456789/141
dc.language.isoen
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=44649151833&origin=inward
dc.titleXPS characterization of TiO2 layers deposited on quartz plates
dc.typeArticle
oaire.citation.issue1
oaire.citation.volume100
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