Electron beam characterization by a tomographic approach

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creativework.publisherInstitute of Physics Publishinghelen.craven@iop.orgen
dc.contributor.authorKoleva E.
dc.contributor.authorMladenov G.
dc.contributor.authorTodorov D.
dc.contributor.authorKoleva L.
dc.contributor.authorKardjiev M.
dc.date.accessioned2024-07-10T14:27:03Z
dc.date.accessioned2024-07-10T14:48:31Z
dc.date.available2024-07-10T14:27:03Z
dc.date.available2024-07-10T14:48:31Z
dc.date.issued2016-04-07
dc.description.abstractIn this paper, experimental data are analyzed for the integral current density distribution when the electron beam parameters are varied, namely, focusing current, beam current, venelt voltage and the distance to the measuring device. The 3D beam radial current density distribution is reconstructed by implementing a tomographic approach. The characterization of the electron beam is considered in connection with the estimation of the following parameters: the radial and the angular beam distribution standard deviations, the position of the beam focus and the beam emittance.
dc.identifier.doi10.1088/1742-6596/700/1/012013
dc.identifier.issn1742-6596
dc.identifier.issn1742-6588
dc.identifier.scopusSCOPUS_ID:84964810928en
dc.identifier.urihttps://rlib.uctm.edu/handle/123456789/376
dc.language.isoen
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84964810928&origin=inward
dc.titleElectron beam characterization by a tomographic approach
dc.typeConference Paper
oaire.citation.issue1
oaire.citation.volume700
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